ISSN 0253-2778

CN 34-1054/N

Open AccessOpen Access JUSTC Original Paper

A high-speed voltage-mode sense amplifier for SRAM

Funds:  Supported by Fundamental Research Funds for the Central Universities (JUSRP51510), Summit of the Six Top Talents Program of Jiangsu Province (2013-DZXX-027), Postgraduate Research & Practice Innovation Program of Jiangsu Province (KYLX16_0776, SJLX16_0500, SJCX17_0510), and China Scholarship Council(201706795031).
Cite this:
https://doi.org/10.3969/j.issn.0253-2778.2018.09.002
More Information
  • Author Bio:

    LIU Kangsheng, male, born in 1992, Master candidate. Research field: IC design and test. E-mail: 562490958@qq.com

  • Corresponding author: YU Zhiguo
  • Received Date: 27 October 2017
  • Accepted Date: 29 April 2017
  • Rev Recd Date: 29 April 2017
  • Publish Date: 30 September 2018
  • This paper reports a novel sense amplifier (SA) suitable for voltage sensing in the read operation of static random access memory (SRAM). Contrary to the conventional cross-coupled SA, an NMOS cross coupling amplifier is added as the second stage amplifier and the pull-up and pull-down circuits are added as the output circuit. The proposed structure can quickly amplify the bit line voltage difference with high gain, improve the sensitivity, and ensure that the data output port of the SRAM encounters no interference when the utility model is not working. The simulation results show that this design reduces 95% of the voltage required for the bit lines to guarantee the full swing at output nodes and shortens 80% of the sensing delay for the same input voltage difference compared with the conventional SA.
    This paper reports a novel sense amplifier (SA) suitable for voltage sensing in the read operation of static random access memory (SRAM). Contrary to the conventional cross-coupled SA, an NMOS cross coupling amplifier is added as the second stage amplifier and the pull-up and pull-down circuits are added as the output circuit. The proposed structure can quickly amplify the bit line voltage difference with high gain, improve the sensitivity, and ensure that the data output port of the SRAM encounters no interference when the utility model is not working. The simulation results show that this design reduces 95% of the voltage required for the bit lines to guarantee the full swing at output nodes and shortens 80% of the sensing delay for the same input voltage difference compared with the conventional SA.
  • loading
  • [1]
    CHRISANTHOPOULOS A, TSIATOUHAS Y, ARAPOYANNI A, et al. SRAM oriented memory sense amplifier design in 0.18 μm CMOS technology [C]// IEEE International Symposium on Circuits and Systems. Phoenix-Scottsdale, USA: IEEE Press, 2002: 145-148.
    [2]
    WEN L, CHENG X, ZHOU K J, et al. Bit-Interleaving-enabled 8T SRAM with shared data-aware write and reference-based sense amplifier [J]. IEEE Transactions on Circuits & Systems II Express Briefs, 2016, 63(7): 643-647.
    [3]
    PENG C Y, TAO Y, LU W, et al. A novel cascade control replica-bitline delay technique for reducing timing process-variation of SRAM sense amplifier [J]. IEICE Electronics Express, 2015, 12(5): 20150102.
    [4]
    MUKHOPADHYAY S, MAHMOODI H, Roy K. Modeling of failure probability and statistical design of SRAM array for yield enhancement in nanoscaled CMOS [J]. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2006, 24(12): 1859-1880.
    [5]
    DO A T, KONG Z H, YEO K S, et al. Design and sensitivity analysis of a new current-mode sense amplifier for low-power SRAM [J]. IEEE Transactions on Very Large Scale Integration Systems, 2011, 19(2): 196-204.
    [6]
    NOH K J, KIM J H, LEE C H, et al. A new dual asymmetric bit-line sense amplifier for low-voltage dynamic random access memory [J]. IEICE Electronics Express, 2013, 10(18): 20130647.
    [7]
    UDDIN N, THIEDE A. Common gate cross-coupled differential amplifier for near-field sensors [J]. Electronics Letters, 2009, 45(18): 918-920.
    [8]
    DO A T, LOW Y S J, KONG Z H, et al. A full current-mode sense amplifier for low-power SRAM applications[C]// IEEE Asia Pacific Conference on Circuits and Systems. Macao, China: IEEE Press, 2008: 1402-1405.
    [9]
    ZHANG H. Design of a high speed sense amplifier circuit [J]. Microelectronics, 2015: 45(3): 294-297.
    [10]
    LEE H, ALZATE J G, DORRANCE R, et al. Design of a fast and low-power sense amplifier and writing circuit for high-speed MRAM [J]. IEEE Transactions on Magnetics, 2015, 51(5): 1-7.
    [11]
    GUNDU A K, HASHMI M S, GROVER A. A new sense amplifier topology with improved performance for high speed SRAM applications[C]// 29th International Conference on VLSI Design and 15th International Conference on Embedded Systems. Kolkata, India: IEEE Press, 2016: 185-190.
    [12]
    JEONG H, KIM T, KANG K, et al. Switching pMOS sense amplifier for high-density low-voltage single-ended SRAM [J]. IEEE Transactions on Circuits & Systems I Regular Papers, 2017, 62(6):1555-1563.
    [13]
    CHOI W, PARK J S, KANG G. Dynamic stability estimation for latch-type voltage sense amplifier[C]// International SoC Design Conference. Jeju, South Korea: IEEE Press, 2014: 218-219.
    [14]
    CHANG M F, SHEN S J, LIU C C, et al. An offset-tolerant current-sampling-based sense amplifier for Sub-100nA-cell-current nonvolatile memory [C]// IEEE International Solid-state Circuits Conference. San Francisco, USA: IEEE Press, 2011: 206-208.
    [15]
    LI Y, WEN L, ZHANG Y, et al. An area-efficient dual replica-bitline delay technique for process-variation-tolerant low voltage SRAM sense amplifier timing [J]. IEICE Electronics Express, 2014, 11(3): 20130992.)
  • 加载中

Catalog

    [1]
    CHRISANTHOPOULOS A, TSIATOUHAS Y, ARAPOYANNI A, et al. SRAM oriented memory sense amplifier design in 0.18 μm CMOS technology [C]// IEEE International Symposium on Circuits and Systems. Phoenix-Scottsdale, USA: IEEE Press, 2002: 145-148.
    [2]
    WEN L, CHENG X, ZHOU K J, et al. Bit-Interleaving-enabled 8T SRAM with shared data-aware write and reference-based sense amplifier [J]. IEEE Transactions on Circuits & Systems II Express Briefs, 2016, 63(7): 643-647.
    [3]
    PENG C Y, TAO Y, LU W, et al. A novel cascade control replica-bitline delay technique for reducing timing process-variation of SRAM sense amplifier [J]. IEICE Electronics Express, 2015, 12(5): 20150102.
    [4]
    MUKHOPADHYAY S, MAHMOODI H, Roy K. Modeling of failure probability and statistical design of SRAM array for yield enhancement in nanoscaled CMOS [J]. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2006, 24(12): 1859-1880.
    [5]
    DO A T, KONG Z H, YEO K S, et al. Design and sensitivity analysis of a new current-mode sense amplifier for low-power SRAM [J]. IEEE Transactions on Very Large Scale Integration Systems, 2011, 19(2): 196-204.
    [6]
    NOH K J, KIM J H, LEE C H, et al. A new dual asymmetric bit-line sense amplifier for low-voltage dynamic random access memory [J]. IEICE Electronics Express, 2013, 10(18): 20130647.
    [7]
    UDDIN N, THIEDE A. Common gate cross-coupled differential amplifier for near-field sensors [J]. Electronics Letters, 2009, 45(18): 918-920.
    [8]
    DO A T, LOW Y S J, KONG Z H, et al. A full current-mode sense amplifier for low-power SRAM applications[C]// IEEE Asia Pacific Conference on Circuits and Systems. Macao, China: IEEE Press, 2008: 1402-1405.
    [9]
    ZHANG H. Design of a high speed sense amplifier circuit [J]. Microelectronics, 2015: 45(3): 294-297.
    [10]
    LEE H, ALZATE J G, DORRANCE R, et al. Design of a fast and low-power sense amplifier and writing circuit for high-speed MRAM [J]. IEEE Transactions on Magnetics, 2015, 51(5): 1-7.
    [11]
    GUNDU A K, HASHMI M S, GROVER A. A new sense amplifier topology with improved performance for high speed SRAM applications[C]// 29th International Conference on VLSI Design and 15th International Conference on Embedded Systems. Kolkata, India: IEEE Press, 2016: 185-190.
    [12]
    JEONG H, KIM T, KANG K, et al. Switching pMOS sense amplifier for high-density low-voltage single-ended SRAM [J]. IEEE Transactions on Circuits & Systems I Regular Papers, 2017, 62(6):1555-1563.
    [13]
    CHOI W, PARK J S, KANG G. Dynamic stability estimation for latch-type voltage sense amplifier[C]// International SoC Design Conference. Jeju, South Korea: IEEE Press, 2014: 218-219.
    [14]
    CHANG M F, SHEN S J, LIU C C, et al. An offset-tolerant current-sampling-based sense amplifier for Sub-100nA-cell-current nonvolatile memory [C]// IEEE International Solid-state Circuits Conference. San Francisco, USA: IEEE Press, 2011: 206-208.
    [15]
    LI Y, WEN L, ZHANG Y, et al. An area-efficient dual replica-bitline delay technique for process-variation-tolerant low voltage SRAM sense amplifier timing [J]. IEICE Electronics Express, 2014, 11(3): 20130992.)

    Article Metrics

    Article views (116) PDF downloads(169)
    Proportional views

    /

    DownLoad:  Full-Size Img  PowerPoint
    Return
    Return